Applied Scanning Probe Methods VI Characterization /
The scanning probe microscopy ?eld has been rapidly expanding. It is a demanding task to collect a timely overview of this ?eld with an emphasis on technical dev- opments and industrial applications. It became evident while editing Vols. I–IV that a large number of technical and applicational aspect...
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| Other Authors: | , |
| Language: | English |
| Published: |
Berlin, Heidelberg :
Springer Berlin Heidelberg : Imprint: Springer,
2007.
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| Edition: | 1st ed. 2007. |
| Series: | NanoScience and Technology,
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| Subjects: | |
| Online Access: | https://doi.org/10.1007/11776314 |