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Applied Scanning Probe Methods VI Characterization /

The scanning probe microscopy ?eld has been rapidly expanding. It is a demanding task to collect a timely overview of this ?eld with an emphasis on technical dev- opments and industrial applications. It became evident while editing Vols. I–IV that a large number of technical and applicational aspect...

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Corporate Author: SpringerLink (Online service)
Other Authors: Bhushan, Bharat. (Editor, http://id.loc.gov/vocabulary/relators/edt), Kawata, Satoshi. (Editor, http://id.loc.gov/vocabulary/relators/edt)
Language:English
Published: Berlin, Heidelberg : Springer Berlin Heidelberg : Imprint: Springer, 2007.
Edition:1st ed. 2007.
Series:NanoScience and Technology,
Subjects:
Nanotechnology.
Materials—Surfaces.
Thin films.
Polymers  .
Physical chemistry.
Solid state physics.
Nanotechnology and Microengineering.
Surfaces and Interfaces, Thin Films.
Polymer Sciences.
Physical Chemistry.
Solid State Physics.
Online Access:https://doi.org/10.1007/11776314

Internet

https://doi.org/10.1007/11776314

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