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Applied Scanning Probe Methods IX Characterization /

The success of the Springer Series Applied Scanning Probe Methods I–VII and the rapidly expanding activities in scanning probe development and applications worldwide made it a natural step to collect further speci c results in the elds of development of scanning probe microscopy techniques (Vol. VII...

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Corporate Author: SpringerLink (Online service)
Other Authors: Bhushan, Bharat. (Editor, http://id.loc.gov/vocabulary/relators/edt), Fuchs, Harald. (Editor, http://id.loc.gov/vocabulary/relators/edt), Tomitori, Masahiko. (Editor, http://id.loc.gov/vocabulary/relators/edt)
Language:English
Published: Berlin, Heidelberg : Springer Berlin Heidelberg : Imprint: Springer, 2008.
Edition:1st ed. 2008.
Series:NanoScience and Technology,
Subjects:
Nanotechnology.
Spectroscopy.
Microscopy.
Surfaces (Physics).
Interfaces (Physical sciences).
Thin films.
Materials—Surfaces.
Polymers  .
Nanotechnology and Microengineering.
Spectroscopy and Microscopy.
Surface and Interface Science, Thin Films.
Surfaces and Interfaces, Thin Films.
Polymer Sciences.
Online Access:https://doi.org/10.1007/978-3-540-74083-4

Internet

https://doi.org/10.1007/978-3-540-74083-4

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