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03991nam a22006255i 4500 |
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978-3-642-40128-2 |
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DE-He213 |
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20210617025644.0 |
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131024s2014 gw | s |||| 0|eng d |
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|a 9783642401282
|9 978-3-642-40128-2
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|a 10.1007/978-3-642-40128-2
|2 doi
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|a 530.417
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|a Ellipsometry of Functional Organic Surfaces and Films
|h [electronic resource] /
|c edited by Karsten Hinrichs, Klaus-Jochen Eichhorn.
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|a 1st ed. 2014.
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|a Berlin, Heidelberg :
|b Springer Berlin Heidelberg :
|b Imprint: Springer,
|c 2014.
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|a XXI, 363 p. 216 illus., 55 illus. in color.
|b online resource.
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|a text
|b txt
|2 rdacontent
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|a computer
|b c
|2 rdamedia
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|a online resource
|b cr
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|a text file
|b PDF
|2 rda
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|a Springer Series in Surface Sciences,
|x 0931-5195 ;
|v 52
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|a Biomolecules at surfaces -- Smart polymer surfaces and films -- Nanostructured surfaces and organic/inorganic hybrids -- Thin films of organic semiconductors for OPV, OLEDs and OTFT -- Developments in ellipsometric real-time/in-situ monitoring techniques -- Infrared brillant light sources for micro-ellipsometric studies of organic films -- Collection of optical constants of organic layers.
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|a Ellipsometry is the method of choice to determine the properties of surfaces and thin films. It provides comprehensive and sensitive characterization in contactless and non-invasive measurements. This book gives a state-of-the-art survey of ellipsometric investigations of organic films and surfaces, from laboratory to synchrotron applications, with a special focus on in-situ use in processing environments and at solid-liquid interfaces. In conjunction with the development of functional organic, meta- and hybrid materials for new optical, electronic, sensing and biotechnological devices and fabrication advances, the ellipsometric analysis of their optical and material properties has progressed rapidly in the recent years.
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|a Surfaces (Physics).
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|a Interfaces (Physical sciences).
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|a Thin films.
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|a Materials—Surfaces.
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|a Physical chemistry.
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|a Lasers.
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|a Photonics.
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|a Materials science.
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|a Surface and Interface Science, Thin Films.
|0 https://scigraph.springernature.com/ontologies/product-market-codes/P25160
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|a Surfaces and Interfaces, Thin Films.
|0 https://scigraph.springernature.com/ontologies/product-market-codes/Z19000
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|a Physical Chemistry.
|0 https://scigraph.springernature.com/ontologies/product-market-codes/C21001
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2 |
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|a Optics, Lasers, Photonics, Optical Devices.
|0 https://scigraph.springernature.com/ontologies/product-market-codes/P31030
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2 |
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|a Characterization and Evaluation of Materials.
|0 https://scigraph.springernature.com/ontologies/product-market-codes/Z17000
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700 |
1 |
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|a Hinrichs, Karsten.
|e editor.
|0 (orcid)0000-0002-6580-7791
|1 https://orcid.org/0000-0002-6580-7791
|4 edt
|4 http://id.loc.gov/vocabulary/relators/edt
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700 |
1 |
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|a Eichhorn, Klaus-Jochen.
|e editor.
|0 (orcid)0000-0002-0431-4918
|1 https://orcid.org/0000-0002-0431-4918
|4 edt
|4 http://id.loc.gov/vocabulary/relators/edt
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|a SpringerLink (Online service)
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|t Springer Nature eBook
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|i Printed edition:
|z 9783642401299
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776 |
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|i Printed edition:
|z 9783642401275
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776 |
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8 |
|i Printed edition:
|z 9783662510209
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830 |
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|a Springer Series in Surface Sciences,
|x 0931-5195 ;
|v 52
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856 |
4 |
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|u https://doi.org/10.1007/978-3-642-40128-2
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|a ZDB-2-CMS
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|a ZDB-2-SXC
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|a Chemistry and Materials Science (SpringerNature-11644)
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|a Chemistry and Material Science (R0) (SpringerNature-43709)
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