Cover Image

Ellipsometry of Functional Organic Surfaces and Films

Ellipsometry is the method of choice to determine the properties of surfaces and thin films. It provides comprehensive and sensitive characterization in contactless and non-invasive measurements. This book gives a state-of-the-art survey of ellipsometric investigations of organic films and surfaces,...

Full description

Corporate Author: SpringerLink (Online service)
Other Authors: Hinrichs, Karsten. (Editor, http://id.loc.gov/vocabulary/relators/edt), Eichhorn, Klaus-Jochen. (Editor, http://id.loc.gov/vocabulary/relators/edt)
Language:English
Published: Berlin, Heidelberg : Springer Berlin Heidelberg : Imprint: Springer, 2014.
Edition:1st ed. 2014.
Series:Springer Series in Surface Sciences, 52
Subjects:
Surfaces (Physics).
Interfaces (Physical sciences).
Thin films.
Materials—Surfaces.
Physical chemistry.
Lasers.
Photonics.
Materials science.
Surface and Interface Science, Thin Films.
Surfaces and Interfaces, Thin Films.
Physical Chemistry.
Optics, Lasers, Photonics, Optical Devices.
Characterization and Evaluation of Materials.
Online Access:https://doi.org/10.1007/978-3-642-40128-2

Internet

https://doi.org/10.1007/978-3-642-40128-2

Similar Items