Design for Manufacturability and Statistical Design A Constructive Approach /
Design for Manufacturability and Statistical Design: A Constructive Approach provides a thorough treatment of the causes of variability, methods for statistical data characterization, and techniques for modeling, analysis, and optimization of integrated circuits to improve yield. The objective of th...
Main Authors: | Orshansky, Michael. (Author, http://id.loc.gov/vocabulary/relators/aut), Nassif, Sani. (http://id.loc.gov/vocabulary/relators/aut), Boning, Duane. (http://id.loc.gov/vocabulary/relators/aut) |
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Corporate Author: | SpringerLink (Online service) |
Language: | English |
Published: |
New York, NY :
Springer US : Imprint: Springer,
2008.
|
Edition: | 1st ed. 2008. |
Series: | Integrated Circuits and Systems,
|
Subjects: | |
Online Access: | https://doi.org/10.1007/978-0-387-69011-7 |
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