Cover Image

Field Emission Scanning Electron Microscopy New Perspectives for Materials Characterization /

This book highlights what is now achievable in terms of materials characterization with the new generation of cold-field emission scanning electron microscopes applied to real materials at high spatial resolution. It discusses advanced scanning electron microscopes/scanning- transmission electron mi...

Full description

Main Authors: Brodusch, Nicolas. (Author, http://id.loc.gov/vocabulary/relators/aut), Demers, Hendrix. (http://id.loc.gov/vocabulary/relators/aut), Gauvin, Raynald. (http://id.loc.gov/vocabulary/relators/aut)
Corporate Author: SpringerLink (Online service)
Language:English
Published: Singapore : Springer Singapore : Imprint: Springer, 2018.
Edition:1st ed. 2018.
Series:SpringerBriefs in Applied Sciences and Technology,
Subjects:
Materials science.
Spectroscopy.
Microscopy.
Nanotechnology.
Characterization and Evaluation of Materials.
Spectroscopy and Microscopy.
Nanotechnology and Microengineering.
Online Access:https://doi.org/10.1007/978-981-10-4433-5

Internet

https://doi.org/10.1007/978-981-10-4433-5

Similar Items