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Gauvin, Raynald.
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Field Emission Scanning Electron Microscopy New Perspectives for Materials Characterization / by Nicolas Brodusch, Hendrix Demers, Raynald Gauvin.
by
Brodusch, Nicolas.
,
Brodusch, Nicolas.
,
Demers, Hendrix.
,
Gauvin
,
Raynald
.
Published 2018
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Related Subjects
Characterization and Evaluation of Materials
Materials science
Microscopy
Nanotechnology
Nanotechnology and Microengineering
Spectroscopy
Spectroscopy and Microscopy
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