Cover Image

Ellipsometry at the Nanoscale

This book presents and introduces ellipsometry in nanoscience and nanotechnology making a bridge between the classical and nanoscale optical behaviour of materials. It delineates the role of the non-destructive and non-invasive optical diagnostics of ellipsometry in improving science and technology...

Full description

Corporate Author: SpringerLink (Online service)
Other Authors: Losurdo, Maria. (Editor, http://id.loc.gov/vocabulary/relators/edt), Hingerl, Kurt. (Editor, http://id.loc.gov/vocabulary/relators/edt)
Language:English
Published: Berlin, Heidelberg : Springer Berlin Heidelberg : Imprint: Springer, 2013.
Edition:1st ed. 2013.
Subjects:
Nanotechnology.
Physical measurements.
Measurement   .
Materials science.
Nanotechnology and Microengineering.
Measurement Science and Instrumentation.
Characterization and Evaluation of Materials.
Online Access:https://doi.org/10.1007/978-3-642-33956-1
Table of Contents:
  • Preamble
  • Preface
  • A Brief History and State of the Art of Ellipsometry.-Advanced Mueller Ellipsometry Instrumentation and Data Analysis
  • Data Analysis for Nanomaterials: Effective Medium Approximation, its Limits and Implementations
  • Relationship between Surface Morphology and Effective Medium Roughness
  • Plasmonics and Effective-Medium Theory
  • Thin films of Nanostructured Plasmonic Noble Metals.-  Spectroscopic Ellipsometry on Metallic Gratings
  • Mueller matrix applied to nanostructures
  • Spectroscopic Ellipsometry and Magneto-Optical Kerr Spectroscopy of Magnetic Garnet Thin Films Incorporating Plasmonic Nanoparticles
  • Generalized Ellipsometry Characterization of Sculptured Thin Films made by Glancing Angle Deposition
  • THz Generalized Ellipsometry characterization of highly-ordered 3-dimensional Nanostructures
  • Infrared ellipsometric investigations of free carriers and lattice vibrations in superconducting cuprates
  • Real-time Ellipsometry for Probing charge-transfer processes at the nanoscale
  • Polarimetric and other Optical Probes for the Solid - Liquid Interface
  • Spectroscopic Ellipsometry for functional nano-layers of flexible organic electronic devices
  • Spectroscopic Ellipsometry of Nanoscale Materials for Semiconductor Device Applications
  • Ellipsometry of semiconductor nanocrystals
  • Spectroscopic Ellipsometry for Inline Process Control in the Semiconductor Industry
  • Thin film applications in research and industry characterized by spectroscopic ellipsometry
  • Ellipsometry and Correlation Measurements
  • Nanotechnology: Applications and markets, present and future.

Similar Items