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Ellipsometry at the Nanoscale

This book presents and introduces ellipsometry in nanoscience and nanotechnology making a bridge between the classical and nanoscale optical behaviour of materials. It delineates the role of the non-destructive and non-invasive optical diagnostics of ellipsometry in improving science and technology...

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Corporate Author: SpringerLink (Online service)
Other Authors: Losurdo, Maria. (Editor, http://id.loc.gov/vocabulary/relators/edt), Hingerl, Kurt. (Editor, http://id.loc.gov/vocabulary/relators/edt)
Language:English
Published: Berlin, Heidelberg : Springer Berlin Heidelberg : Imprint: Springer, 2013.
Edition:1st ed. 2013.
Subjects:
Nanotechnology.
Physical measurements.
Measurement   .
Materials science.
Nanotechnology and Microengineering.
Measurement Science and Instrumentation.
Characterization and Evaluation of Materials.
Online Access:https://doi.org/10.1007/978-3-642-33956-1

Internet

https://doi.org/10.1007/978-3-642-33956-1

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