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Factors Governing Tin Whisker Growth

Tin (Sn) whiskers are electrically conductive, single crystal eruptions that grow from Sn film surfaces. Their high aspect ratio presents reliability problems for the electronics industry due to bridging and metal arcing, leading to malfunctions and catastrophic failures in many electronic systems (...

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Main Author: Crandall, Erika R. (Author, http://id.loc.gov/vocabulary/relators/aut)
Corporate Author: SpringerLink (Online service)
Language:English
Published: Cham : Springer International Publishing : Imprint: Springer, 2013.
Edition:1st ed. 2013.
Series:Springer Theses, Recognizing Outstanding Ph.D. Research,
Subjects:
Electronic circuits.
Metals.
Materials—Surfaces.
Thin films.
Surfaces (Physics).
Interfaces (Physical sciences).
Electronic Circuits and Devices.
Circuits and Systems.
Metallic Materials.
Surfaces and Interfaces, Thin Films.
Surface and Interface Science, Thin Films.
Online Access:https://doi.org/10.1007/978-3-319-00470-9

Internet

https://doi.org/10.1007/978-3-319-00470-9

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