Emerging nanotechnologies : test, defect tolerance, and reliability
| Other Authors: | |
|---|---|
| Published: |
New York:
Springer Verlag,
2008.
|
| Series: | Frontiers in electronic testing;
37 |
| Subjects: |
KOLEKSI TERBUKA
| Call Number: |
T 174.7 .E4 2008 |
|---|
| Accession | Item Category | Format | Status | Notes |
|---|
| 1100066748 | Open Shelf | Book | AVAILABLE |