Emerging nanotechnologies : test, defect tolerance, and reliability

Other Authors: Tehranipoor, Mohammad H.
Published: New York: Springer Verlag, 2008.
Series:Frontiers in electronic testing; 37
Subjects:
LEADER 00623cam a2200181 7i4500
001 0000065544
005 20091125090000.0
008 090911s2008 nyua
020 # 0 |a 9780387747460  
090 0 0 |a T 174.7   |b .E4 2008 
245 0 0 |a Emerging nanotechnologies :   |b test, defect tolerance, and reliability   |c Mohammad Tehranipoor, editor. 
260 # # |a New York:   |b Springer Verlag,   |c 2008. 
300 # # |a xii, 405 p.:   |b ill.;   |c 24 cm.. 
490 0 0 |a Frontiers in electronic testing;   |v 37 
650 0 0 |a Microtechnology  
650 0 0 |a Nanotechnology  
700 1 1 |a Tehranipoor, Mohammad H.  
999 |a 1100066748  |b Book  |c Open Shelf  |e KOLEKSI TERBUKA