|
|
|
|
| LEADER |
00683cam a2200205 7i4500 |
| 001 |
0000054871 |
| 005 |
20080117090000.0 |
| 008 |
080113s2006 eng |
| 020 |
# |
# |
|a 9780387292601 (hbk.)
|
| 020 |
# |
# |
|a 0387292608 (hbk.)
|
| 090 |
0 |
0 |
|a QC 176.83
|b .A4 2006
|
| 100 |
1 |
# |
|a Alford, Terry L.
|
| 245 |
1 |
0 |
|a Fundamentals of nanoscale film analysis
|c Terry L. Alford, Leonard C. Feldman and James W. Mayer.
|
| 260 |
# |
# |
|a London:
|b Springer,
|c 2007.
|
| 300 |
# |
# |
|a xiv, 336 p.:
|b ill.;
|c 25 cm..
|
| 650 |
0 |
0 |
|a Nanostructured materials
|
| 650 |
0 |
0 |
|a Thin films
|
| 700 |
1 |
1 |
|a Mayer, James W.
|
| 700 |
1 |
1 |
|a Feldman, Leonard C.
|
| 999 |
|
|
|a 1100051028
|b Book
|c Open Shelf
|e KOLEKSI TERBUKA
|
