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Fundamentals of nanoscale film...
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Fundamentals of nanoscale film analysis
Main Author:
Alford, Terry L.
Other Authors:
Mayer, James W.
,
Feldman, Leonard C.
Language:
English
Published:
London:
Springer,
2007.
Subjects:
Nanostructured materials
Thin films
Holdings
Description
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KOLEKSI TERBUKA
Call Number:
QC 176.83 .A4 2006
Accession
Item Category
Format
Status
Notes
1100051028
Open Shelf
Book
AVAILABLE
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