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Evolution of Thin Film Morphology Modeling and Simulations / by Matthew Pelliccione, Toh-Ming Lu.

by Pelliccione, Matthew., Pelliccione, Matthew., Lu, Toh-Ming.
Published 2008

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2

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Dielectric Breakdown in Gigascale Electronics Time Dependent Failure Mechanisms / by Juan Pablo Borja, Toh-Ming Lu, Joel Plawsky.

by Borja, Juan Pablo., Borja, Juan Pablo., Lu, Toh-Ming., Plawsky, Joel.
Published 2016

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