Electromigration Modeling at Circuit Layout Level
Integrated circuit (IC) reliability is of increasing concern in present-day IC technology where the interconnect failures significantly increases the failure rate for ICs with decreasing interconnect dimension and increasing number of interconnect levels. Electromigration (EM) of interconnects has...
| Main Authors: | , |
|---|---|
| Corporate Author: | |
| Language: | English |
| Published: |
Singapore :
Springer Singapore : Imprint: Springer,
2013.
|
| Edition: | 1st ed. 2013. |
| Series: | SpringerBriefs in Reliability,
|
| Subjects: | |
| Online Access: | https://doi.org/10.1007/978-981-4451-21-5 |