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Design, Analysis and Test of Logic Circuits Under Uncertainty

Integrated circuits (ICs) increasingly exhibit uncertain characteristics due to soft errors, inherently probabilistic devices, and manufacturing variability. As device technologies scale, these effects can be detrimental to the reliability of logic circuits.  To improve future semiconductor designs,...

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Main Authors: Krishnaswamy, Smita. (Author, http://id.loc.gov/vocabulary/relators/aut), Markov, Igor L. (http://id.loc.gov/vocabulary/relators/aut), Hayes, John P. (http://id.loc.gov/vocabulary/relators/aut)
Corporate Author: SpringerLink (Online service)
Language:English
Published: Dordrecht : Springer Netherlands : Imprint: Springer, 2013.
Edition:1st ed. 2013.
Series:Lecture Notes in Electrical Engineering, 115
Subjects:
Electronic circuits.
Arithmetic and logic units, Computer.
Computer hardware.
Computer software—Reusability.
Logic design.
Computer science—Mathematics.
Circuits and Systems.
Arithmetic and Logic Structures.
Computer Hardware.
Performance and Reliability.
Logic Design.
Symbolic and Algebraic Manipulation.
Online Access:https://doi.org/10.1007/978-90-481-9644-9

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https://doi.org/10.1007/978-90-481-9644-9

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