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Magnetic Resonance of Semiconductors and Their Nanostructures Basic and Advanced Applications /

This book explains different magnetic resonance (MR) techniques and uses different combinations of these techniques to analyze defects in semiconductors and nanostructures. It also introduces novelties such as single defects MR and electron-paramagnetic-resonance-based methods: electron spin echo, e...

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Main Authors: Baranov, Pavel G. (Author, http://id.loc.gov/vocabulary/relators/aut), von Bardeleben, Hans Jürgen. (http://id.loc.gov/vocabulary/relators/aut), Jelezko, Fedor. (http://id.loc.gov/vocabulary/relators/aut), Wrachtrup, Jörg. (http://id.loc.gov/vocabulary/relators/aut)
Corporate Author: SpringerLink (Online service)
Language:English
Published: Vienna : Springer Vienna : Imprint: Springer, 2017.
Edition:1st ed. 2017.
Series:Springer Series in Materials Science, 253
Subjects:
Semiconductors.
Spectroscopy.
Materials science.
Magnetism.
Magnetic materials.
Nanotechnology.
Physics.
Spectroscopy/Spectrometry.
Characterization and Evaluation of Materials.
Magnetism, Magnetic Materials.
Applied and Technical Physics.
Online Access:https://doi.org/10.1007/978-3-7091-1157-4
Table of Contents:
  • Preface
  • Basic Concepts of Electron Paramagnetic Resonance (EPR)
  • Fundamentals of EPR Related Methods
  • Magnetic Resonance Studies of Intrinsic Defects in Semiconductors
  • State-of-Art: High-Frequency EPR, ESE, ENDOR and ODMR in Wide-Band-Gap Semiconductors
  • Magnetic Resonance in Semiconductor Micro- and Nanostructures
  • Perspectives of Applications of Magnetic Properties of Semiconductor Nanostructures and Single Defects.

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