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04459nam a22006615i 4500 |
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|a 9783642405945
|9 978-3-642-40594-5
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|a 10.1007/978-3-642-40594-5
|2 doi
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|a 621.36
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|a Frontiers in Optical Methods
|h [electronic resource] :
|b Nano-Characterization and Coherent Control /
|c edited by Ken-ichi Shudo, Ikufumui Katayama, Shin-Ya Ohno.
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|a 1st ed. 2014.
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|a Berlin, Heidelberg :
|b Springer Berlin Heidelberg :
|b Imprint: Springer,
|c 2014.
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|a XII, 228 p. 139 illus., 70 illus. in color.
|b online resource.
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|a text
|b txt
|2 rdacontent
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|a computer
|b c
|2 rdamedia
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|a online resource
|b cr
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|a text file
|b PDF
|2 rda
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|a Springer Series in Optical Sciences,
|x 0342-4111 ;
|v 180
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|a State-of-Art of Terahertz Science and Technology -- Broadband Terahertz Spectroscopy and its Application to the Characterization of Thin Films -- Single Photon Counting and Passive Microscopy of Terahertz Radiation -- Coherent Phonons in Carbon Nanotubes -- Time-resolved X-ray Diffraction Studies of Coherent Lattice Dynamics Using Synchrotron Radiation -- Imaging GHz-THz Acoustic Wave Propagation in Thin Films and Microstructures -- Material Evaluation with Various Optical Measurement Systems: Focusing on Terahertz Spectroscopy -- Ultrafast Excitation and Dynamics Measurements with Intense Ultrashort Laser Pulses: High-Order Harmonic Generation from Aligning Molecules and Surface Nanostructuring -- Real Space Mapping of Exciton Interaction Strength in GaN Films by using Four-Wave-Mixing Technique -- Terahertz Light Source Based on Synchrotron Radiation -- Terahertz Synchrotron Radiation; Optics and Application -- Far-infrared Spectroscopy on Solids under Ultra High Pressures -- Real-time Analysis of Initial Oxidation Process on Si(001) by Means of Surface Differential Reflectance Spectroscopy and Reflectance Difference Spectroscopy.
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|a This collection of reviews by leading Japanese researchers covers topics like ultrafast optical responses, terahertz and phonon studies, super-sensitive surface and high-pressure spectroscopy, combination of visible and x-ray photonics. Several related areas at the cutting edge of measurement technology and materials science are included. This book is partly based on well-cited review articles in the Japanese language in special volumes of the Journal of the Vacuum Society of Japan.
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|a Lasers.
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|a Photonics.
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|a Atoms.
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|a Physics.
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|a Spectroscopy.
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|a Microscopy.
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|a Microwaves.
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|a Optical engineering.
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|a Nanotechnology.
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|a Optics, Lasers, Photonics, Optical Devices.
|0 https://scigraph.springernature.com/ontologies/product-market-codes/P31030
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2 |
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|a Atomic, Molecular, Optical and Plasma Physics.
|0 https://scigraph.springernature.com/ontologies/product-market-codes/P24009
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2 |
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|a Spectroscopy and Microscopy.
|0 https://scigraph.springernature.com/ontologies/product-market-codes/P31090
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|a Microwaves, RF and Optical Engineering.
|0 https://scigraph.springernature.com/ontologies/product-market-codes/T24019
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|a Nanotechnology.
|0 https://scigraph.springernature.com/ontologies/product-market-codes/Z14000
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|a Shudo, Ken-ichi.
|e editor.
|4 edt
|4 http://id.loc.gov/vocabulary/relators/edt
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|a Katayama, Ikufumui.
|e editor.
|4 edt
|4 http://id.loc.gov/vocabulary/relators/edt
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1 |
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|a Ohno, Shin-Ya.
|e editor.
|4 edt
|4 http://id.loc.gov/vocabulary/relators/edt
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710 |
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|a SpringerLink (Online service)
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|t Springer Nature eBook
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|i Printed edition:
|z 9783642405952
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776 |
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|i Printed edition:
|z 9783642405938
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|i Printed edition:
|z 9783662507315
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830 |
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|a Springer Series in Optical Sciences,
|x 0342-4111 ;
|v 180
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856 |
4 |
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|u https://doi.org/10.1007/978-3-642-40594-5
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|a ZDB-2-PHA
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|a ZDB-2-SXP
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|a Physics and Astronomy (SpringerNature-11651)
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|a Physics and Astronomy (R0) (SpringerNature-43715)
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