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Ferroelectric Domain Walls Statics, Dynamics, and Functionalities Revealed by Atomic Force Microscopy /

Using the nanometric resolution of atomic force microscopy techniques, this work explores the rich fundamental physics and novel functionalities of domain walls in ferroelectric materials, the nanoscale interfaces separating regions of differently oriented spontaneous polarization. Due to the local...

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Main Author: Guyonnet, Jill. (Author, http://id.loc.gov/vocabulary/relators/aut)
Corporate Author: SpringerLink (Online service)
Language:English
Published: Cham : Springer International Publishing : Imprint: Springer, 2014.
Edition:1st ed. 2014.
Series:Springer Theses, Recognizing Outstanding Ph.D. Research,
Subjects:
Surfaces (Physics).
Interfaces (Physical sciences).
Thin films.
Optical materials.
Electronic materials.
Spectroscopy.
Microscopy.
Nanotechnology.
Nanoscale science.
Nanoscience.
Nanostructures.
Surface and Interface Science, Thin Films.
Optical and Electronic Materials.
Spectroscopy and Microscopy.
Nanoscale Science and Technology.
Online Access:https://doi.org/10.1007/978-3-319-05750-7

Internet

https://doi.org/10.1007/978-3-319-05750-7

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