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Computational Pathology and Ophthalmic Medical Image Analysis First International Workshop, COMPAY 2018, and 5th International Workshop, OMIA 2018, Held in Conjunction with MICCAI 2018, Granada, Spain, September 16 - 20, 2018, Proceedings /

This book constitutes the refereed joint proceedings of the First International Workshop on Computational Pathology, COMPAY 2018, and the 5th International Workshop on Ophthalmic Medical Image Analysis, OMIA 2018, held in conjunction with the 21st International Conference on Medical Imaging and Comp...

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Corporate Author: SpringerLink (Online service)
Other Authors: Stoyanov, Danail. (Editor, http://id.loc.gov/vocabulary/relators/edt), Taylor, Zeike. (Editor, http://id.loc.gov/vocabulary/relators/edt), Ciompi, Francesco. (Editor, http://id.loc.gov/vocabulary/relators/edt), Xu, Yanwu. (Editor, http://id.loc.gov/vocabulary/relators/edt), Martel, Anne. (Editor, http://id.loc.gov/vocabulary/relators/edt), Maier-Hein, Lena. (Editor, http://id.loc.gov/vocabulary/relators/edt), Rajpoot, Nasir. (Editor, http://id.loc.gov/vocabulary/relators/edt), van der Laak, Jeroen. (Editor, http://id.loc.gov/vocabulary/relators/edt), Veta, Mitko. (Editor, http://id.loc.gov/vocabulary/relators/edt), McKenna, Stephen. (Editor, http://id.loc.gov/vocabulary/relators/edt), Snead, David. (Editor, http://id.loc.gov/vocabulary/relators/edt), Trucco, Emanuele. (Editor, http://id.loc.gov/vocabulary/relators/edt), Garvin, Mona K. (Editor, http://id.loc.gov/vocabulary/relators/edt), Chen, Xin Jan. (Editor, http://id.loc.gov/vocabulary/relators/edt), Bogunovic, Hrvoje. (Editor, http://id.loc.gov/vocabulary/relators/edt)
Language:English
Published: Cham : Springer International Publishing : Imprint: Springer, 2018.
Edition:1st ed. 2018.
Series:Image Processing, Computer Vision, Pattern Recognition, and Graphics ; 11039
Subjects:
Optical data processing.
Artificial intelligence.
Arithmetic and logic units, Computer.
Mathematical statistics.
Pattern recognition.
Image Processing and Computer Vision.
Artificial Intelligence.
Arithmetic and Logic Structures.
Probability and Statistics in Computer Science.
Pattern Recognition.
Online Access:https://doi.org/10.1007/978-3-030-00949-6

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https://doi.org/10.1007/978-3-030-00949-6

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