Embedded Memory Design for Multi-Core and Systems on Chip

This book describes the various tradeoffs systems designers face when designing embedded memory.  Readers designing multi-core systems and systems on chip will benefit from the discussion of different topics from memory architecture, array organization, circuit design techniques and design for test....

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Main Author: Mohammad, Baker. (Author, http://id.loc.gov/vocabulary/relators/aut)
Corporate Author: SpringerLink (Online service)
Language:English
Published: New York, NY : Springer New York : Imprint: Springer, 2014.
Edition:1st ed. 2014.
Series:Analog Circuits and Signal Processing, 116
Subjects:
Online Access:https://doi.org/10.1007/978-1-4614-8881-1
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505 0 |a Introduction -- Cache Architecture and Main Blocks -- Embedded Memory Hierarchy -- SRAM Memory Operation and Yield -- Low Power and High Yield SRAM Memory -- Leakage Reduction -- Embedded Memory Verification -- Embedded Memory Design Validation and Design For Test -- Emerging Memory Technology Opportunities and Challenges. 
520 |a This book describes the various tradeoffs systems designers face when designing embedded memory.  Readers designing multi-core systems and systems on chip will benefit from the discussion of different topics from memory architecture, array organization, circuit design techniques and design for test.  The presentation enables a multi-disciplinary approach to chip design, which bridges the gap between the architecture level and circuit level, in order to address yield, reliability and power-related issues for embedded memory.  ·         Provides a comprehensive overview of embedded memory design and associated challenges and choices; ·         Explains tradeoffs and dependencies across different disciplines involved with multi-core and system on chip memory design; ·         Includes detailed discussion of memory hierarchy and its impact on energy and performance; ·         Uses real product examples to demonstrate embedded memory design flow from architecture, to circuit design, design for test and yield analysis. 
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