Analog IC Reliability in Nanometer CMOS

This book focuses on modeling, simulation and analysis of analog circuit aging. First, all important nanometer CMOS physical effects resulting in circuit unreliability are reviewed. Then, transistor aging compact models for circuit simulation are discussed and several methods for efficient circuit r...

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Main Authors: Maricau, Elie. (Author, http://id.loc.gov/vocabulary/relators/aut), Gielen, Georges. (http://id.loc.gov/vocabulary/relators/aut)
Corporate Author: SpringerLink (Online service)
Language:English
Published: New York, NY : Springer New York : Imprint: Springer, 2013.
Edition:1st ed. 2013.
Series:Analog Circuits and Signal Processing,
Subjects:
Online Access:https://doi.org/10.1007/978-1-4614-6163-0