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ESD Protection Device and Circuit Design for Advanced CMOS Technologies

The challenges associated with the design and implementation of Electrostatic Discharge (ESD) protection circuits are becoming increasingly complex as technology is scaled well into nano-metric regime. Traditional approaches of ESD design may not be adequate as the ESD damages occur at successively...

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Main Authors: Semenov, Oleg. (Author, http://id.loc.gov/vocabulary/relators/aut), Sarbishaei, Hossein. (http://id.loc.gov/vocabulary/relators/aut), Sachdev, Manoj. (http://id.loc.gov/vocabulary/relators/aut)
Corporate Author: SpringerLink (Online service)
Language:English
Published: Dordrecht : Springer Netherlands : Imprint: Springer, 2008.
Edition:1st ed. 2008.
Subjects:
Electronics.
Microelectronics.
Electronic circuits.
Optical materials.
Electronic materials.
Solid state physics.
Spectroscopy.
Microscopy.
Electronics and Microelectronics, Instrumentation.
Circuits and Systems.
Optical and Electronic Materials.
Solid State Physics.
Spectroscopy and Microscopy.
Online Access:https://doi.org/10.1007/978-1-4020-8301-3

Internet

https://doi.org/10.1007/978-1-4020-8301-3

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