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Testing complex and embedded s...
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Testing complex and embedded systems
Main Author:
Pries, Kim H.
Other Authors:
Quigley, Jon M.
Language:
English
Published:
Boca Raton, FL:
CRC Press (Taylor & Francis Group),
2011.
Subjects:
Embedded computer systems --
>
Testing
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KOLEKSI TERBUKA
Call Number:
TK 7895 .E42 P7 2011
Accession
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Format
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Notes
1100086143
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AVAILABLE
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