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00790cam a2200217 7i4500 |
001 |
0000095218 |
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20140415090000.0 |
008 |
110704s2010 gw a b 0 eng |
020 |
# |
0 |
|a 9783527323500 (hbk.)
|
020 |
# |
0 |
|a 3527323503 (hbk.)
|
090 |
0 |
0 |
|a QD 139 .T7
|b T72 2010
|
245 |
0 |
0 |
|a Trace analysis with nanomaterials
|c edited by David T. Pierce and Julia Xiaojun Zhao.
|
260 |
# |
# |
|a Weinheim Germany:
|b Wiley-VCH Verlag GmbH & Co.,
|c 2010.
|
300 |
# |
# |
|a xxi, 396 p.:
|b ill. (some col.);
|c 25 cm..
|
504 |
0 |
0 |
|a Includes bibliographical references and index
|
590 |
# |
# |
|a Pusat Pengajian Sains Asas
|
650 |
0 |
0 |
|a Nanostructured materials
|
650 |
0 |
0 |
|a Trace analysis
|
700 |
1 |
1 |
|a Zhao, Julia Xiaojun
|
700 |
1 |
1 |
|a Pierce, David T.
|
999 |
|
|
|a 1100080562
|b Book
|c Open Shelf
|e KOLEKSI TERBUKA
|