Image pattern recognition : synthesis and analysis in biometrics

Other Authors: Yanushkevich, Svetlana N., Nixon, Mark S.
Language:English
Published: Hackensack, NJ: World Scientific, 2007.
Series:Series in machine perception and artificial intelligence; v. 67
Subjects:
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020 # 0 |a 9812569081  
020 # 0 |a 9789812569080  
090 0 0 |a TK 7882 .P3   |b I4 2007 
245 0 0 |a Image pattern recognition :   |b synthesis and analysis in biometrics   |c editors, Svetlana N. Yanushkevich ... [et al.]. 
260 # # |a Hackensack, NJ:   |b World Scientific,   |c 2007. 
300 # # |a xxi, 430 p.:   |b ill.;   |c 24 cm.. 
490 0 0 |a Series in machine perception and artificial intelligence;   |v v. 67 
504 0 0 |a Includes bibliographical references and indexes 
650 0 0 |a Pattern recognition systems --   |x Mathematical models --   |x Congresses  
650 0 0 |a Artificial intelligence --   |x Congresses  
650 0 0 |a Pattern recognition systems --   |x Congresses  
700 1 1 |a Yanushkevich, Svetlana N.  
700 1 1 |a Nixon, Mark S.  
999 |a 1100068969  |b Book  |c Open Shelf  |e KOLEKSI TERBUKA