Applied cryptanalysis : breaking ciphers in the real world

Main Author: Stamp, Mark
Other Authors: Low, Richard M.
Language:English
Published: Hoboken, N.J.: Wiley-Interscience, 2007.
Subjects:
Physical Description:xix, 401 p.: ill.; 25 cm..
Bibliography:Includes bibliographical references (p. 375-392) and index
ISBN:9780470114865
047011486X