Statistical methods for survival data analysis

Main Author: Lee, Elisa T. (Author)
Other Authors: Wang, John Wenyu
Published: Hoboken, NJ: John Wiley & Sons, [2003]
Edition:Third edition
Series:Wiley series in probability and statistics
Subjects:
Physical Description:xii, 513 pages: illustrations; 24 cm
Bibliography:Includes bibliographical references and index
ISBN:0471369977
9780471369974