Applied logistic regression

Main Author: Hosmer, David W. (Author)
Other Authors: Lemeshow, Stanley
Published: New York: John Wiley, [2000]
Edition:Second edition
Series:Wiley series in probability and statistics. Texts and references section
Subjects:

KOLEKSI TERBUKA

Call Number: QA 278.2 .H6 2000
Accession Item Category Format Status Notes
1100019286 Open Shelf Book CIRCULATED
Due Date: 20/07/2024 Reserve