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Digital circuit testing and testability

Main Author: Lala, 1948-
Language:English
Published: San Diego: Academic Press, c1997..
Subjects:
Digital integrated circuits -- > Testing.
Integrated circuits -- > Fault tolerance.
Integrated circuits -- > Very large scale integration -- > Testing.

KOLEKSI TERBUKA

Call Number: TK 7874.75 L193
Accession Item Category Format Status Notes
1000386471 Open Shelf Book AVAILABLE

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