|
|
|
|
LEADER |
00818cam a2200217 7i4500 |
001 |
0000074802 |
005 |
20091216090000.0 |
008 |
091216s2008 enk eng |
020 |
# |
0 |
|a 9781601981387
|
090 |
0 |
0 |
|a TK 8315
|b .T8 2008
|
100 |
1 |
# |
|a Tuytelaars, Tinne
|
245 |
1 |
0 |
|a Local invariant feature detectors :
|b a survey
|c Tinne Tuytelaars and Krystian Mikolajczyk.
|
260 |
# |
# |
|a New York:
|b Wiley VCH,
|c 2008.
|
300 |
# |
# |
|a xii, 109 p.;
|c 24 cm..
|
490 |
0 |
0 |
|a Foundations and Trends in Computer Graphics and Vision Vol.3, Issue 3, 2007
|
504 |
0 |
0 |
|a Includes bibliographical references and index
|
650 |
0 |
0 |
|a Image analysis
|
650 |
0 |
0 |
|a Pattern recognition systems
|
650 |
0 |
0 |
|a Image processing --
|x Digital techniques
|
700 |
1 |
1 |
|a Mikolajczyk, Krystian
|
999 |
|
|
|a 1100075944
|b Book
|c Open Shelf
|e KOLEKSI TERBUKA
|