Local invariant feature detectors : a survey

Main Author: Tuytelaars, Tinne
Other Authors: Mikolajczyk, Krystian
Language:English
Published: New York: Wiley VCH, 2008.
Series:Foundations and Trends in Computer Graphics and Vision Vol.3, Issue 3, 2007
Subjects:
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020 # 0 |a 9781601981387  
090 0 0 |a TK 8315   |b .T8 2008 
100 1 # |a Tuytelaars, Tinne  
245 1 0 |a Local invariant feature detectors :   |b a survey   |c Tinne Tuytelaars and Krystian Mikolajczyk. 
260 # # |a New York:   |b Wiley VCH,   |c 2008. 
300 # # |a xii, 109 p.;   |c 24 cm.. 
490 0 0 |a Foundations and Trends in Computer Graphics and Vision Vol.3, Issue 3, 2007 
504 0 0 |a Includes bibliographical references and index 
650 0 0 |a Image analysis  
650 0 0 |a Pattern recognition systems  
650 0 0 |a Image processing --   |x Digital techniques  
700 1 1 |a Mikolajczyk, Krystian  
999 |a 1100075944  |b Book  |c Open Shelf  |e KOLEKSI TERBUKA