Scanning probe microscopy : electrical and electromechanical phenomena at the nanoscale
| Other Authors: | , |
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| Published: |
New York:
Springer,
2007.
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| Subjects: |
| Physical Description: | 2 v. (xx, 980 p.): ill. (some col.); 25 cm.. |
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| Bibliography: | Includes bibliographical references and index |
| ISBN: | 0387286675 (2-v. set : hbk.) 9780387286679 (2-v. set : hbk.) |