CTL for test information of digital ICs
| Main Author: | |
|---|---|
| Published: |
Boston:
Kluwer Academic Publishers,
2003.
|
| Subjects: |
| LEADER | 00532cam a2200157 7i4500 | ||
|---|---|---|---|
| 001 | 0000033935 | ||
| 005 | 20040512090000.0 | ||
| 020 | # | 0 | |a 1402072937 |
| 090 | 0 | 0 | |a TK 7874.64 |b K17 |
| 100 | 1 | # | |a Kapur |
| 245 | 1 | 0 | |a CTL for test information of digital ICs |c by Rohit Kapur. |
| 260 | # | # | |a Boston: |b Kluwer Academic Publishers, |c 2003. |
| 300 | # | # | |a 173 p.: |b ill.; |c 24 cm. |
| 650 | 0 | 0 | |a Computer hardware description languages |
| 650 | 0 | 0 | |a Digital integrated circuits -- |x Testing -- |x Standards |
| 999 | |a 1100022143 |b Book |c Open Shelf |e KOLEKSI TERBUKA | ||